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Anthracene parallel vertical waveguides

Collection + excitation Si3N4 waveguides normal to the crystal, offset in y; coupling and cross-talk vs. polarization.

Two Si3N4 waveguides are normal to the crystal and propagate along z. The collection guide is centered over an emitter in a 200 nm anthracene film on silver. The excitation guide is displaced by 1.0 um in y.

For each Ex/Ey polarization family:

  1. a point-dipole simulation measures coupling into both waveguide ports;
  2. a unit-power excitation-guide mode is injected with no dipole source and cross-talk into the collection guide is measured.

Both waveguides use exact z-normal Tidy3D mode decomposition at two monitor planes. The duplicate planes provide a built-in port-power consistency check.

python study.py --dry-run
python study.py --estimate
python study.py --run --max-flexcredits 5
python study.py --report
python convergence.py --estimate
python convergence.py --run

The cost guard includes all FlexCredits already billed by the preceding dual-angle study. The convergence script repeats all four production cases on a finer mesh and writes data/convergence_metrics.json. The combined HTML report is at reports/study_report.html.

Results

Anthracene with two parallel vertical waveguides

Technical summary

Eight simulations were completed: Ex- and Ey-oriented dipoles plus Ex- and Ey-like excitation-waveguide inputs, each on the baseline and fine meshes. The fine-mesh results give 43.889% (Ex) and 41.795% (Ey) collection beta into the guide above the emitter. Fine-mesh excitation-to-collection cross-talk is 0.19749% (-27.044 dB) for Ex and 0.074675% (-31.268 dB) for Ey.

Mesh refinement changes collection beta by only 1.2-1.5% and mean cross-talk by 0.08-0.18 dB. The exact cross-talk remains output-plane dependent because the two guides propagate in parallel and behave as a short directional coupler; the report therefore preserves both z-plane values instead of treating the mean as length independent.

Geometry shared by all eight simulations

A 200 nm anthracene film (n=1.8) lies on silver with an emitter at its mid-plane. Two 400 x 300 nm Si3N4 guides in SiO2 are normal to the xy surface and propagate along z. The collection guide is centered over the emitter; the excitation guide is displaced by 1.0 um in +y.

y-z geometry

cleaved facet

The dipole tests use the point source shown in the first cross-section. The two waveguide-input tests use the z-normal mode-source plane shown below; Ex and Ey differ only by selected mode polarization. The physical structures are otherwise identical for every run.

excitation-mode source geometry

Simulation matrix and definitions

Four source configurations were run on each of two meshes, for eight completed simulations:

  • Ex dipole, no injected mode.
  • Ey dipole, no injected mode.
  • Unit-power Ex-like excitation-guide mode, no dipole.
  • Unit-power Ey-like excitation-guide mode, no dipole.

Dipole beta is matching guided-mode power divided by net outward power through the six-face emitter box. Cross-talk is matching collection-mode power divided by measured incident excitation-mode power. Both ports are evaluated at z=1.20 and 1.70 um. Plane-specific values are reported below; the headline value is the ratio of the mean powers, and relative plane mismatch is |P2-P1|/mean(P1,P2).

Completed simulation coverage

Every row below has its numerical results and both y-z and emitter-plane x-y field plots in this report. Dipole and mode-input geometry figures are shared only where the physical geometry is identical.

Mesh Job Source Polarization Geometry evidence Numerical evidence Field evidence
Baseline pvw_Ex_dipole Point dipole Ex Dipole y-z and facet geometry Dipole coupling, two-plane beta, six-face power Baseline Ex dipole y-z and x-y
Baseline pvw_Ey_dipole Point dipole Ey Dipole y-z and facet geometry Dipole coupling, two-plane beta, six-face power Baseline Ey dipole y-z and x-y
Baseline pvw_Ex_excitation_input Excitation-guide mode Ex-like mode 0 Mode-source y-z geometry Incident power, cross-talk, reflection, emitter field Baseline Ex input y-z and x-y
Baseline pvw_Ey_excitation_input Excitation-guide mode Ey-like mode 1 Mode-source y-z geometry Incident power, cross-talk, reflection, emitter field Baseline Ey input y-z and x-y
Fine pvw_fine_Ex_dipole Point dipole Ex Fine mesh plus dipole geometry Fine dipole coupling, two-plane beta, six-face power Fine Ex dipole y-z and x-y
Fine pvw_fine_Ey_dipole Point dipole Ey Fine mesh plus dipole geometry Fine dipole coupling, two-plane beta, six-face power Fine Ey dipole y-z and x-y
Fine pvw_fine_Ex_excitation_input Excitation-guide mode Ex-like mode 0 Fine mesh plus mode-source geometry Fine incident power, cross-talk, reflection, emitter field Fine Ex input y-z and x-y
Fine pvw_fine_Ey_excitation_input Excitation-guide mode Ey-like mode 1 Fine mesh plus mode-source geometry Fine incident power, cross-talk, reflection, emitter field Fine Ey input y-z and x-y

Mode identification

Polarization Selected mode Collection n_eff Excitation n_eff
Ex 0 1.680827 1.680827
Ey 1 1.656439 1.656439

Dipole coupling

Pol. Total dipole power Collection P1 Collection P2 Collection beta Collection orthogonal beta Excitation P1 Excitation P2 Excitation beta Excitation orthogonal beta
Ex 1.718379e+03 7.337033e+02 7.525206e+02 43.245% 3.1975e-15% 2.589731e+00 1.887500e+00 0.13027% 1.9367e-13%
Ey 1.782328e+03 7.253738e+02 7.474088e+02 41.316% 2.0147e-14% 6.457585e-01 1.037377e+00 0.047217% 2.9734e-13%

The collection guide above the emitter captures more than 41% for either dipole orientation, while coupling into the guide displaced by 1 um stays below 0.14%. The chart shows this strong spatial selectivity; exact values remain in the table.

dipole coupling comparison

Excitation-guide to collection-guide cross-talk

Pol. Incident P1 Incident P2 Collection P1 Collection P2 Matching cross-talk Cross-talk dB Orthogonal conversion Total guided transfer Reflection Collection plane mismatch
Ex 9.817582e-01 9.780305e-01 2.189988e-03 1.749001e-03 0.20099% -26.968 dB 7.8216e-14% 0.20099% 63.219% 22.391%
Ey 9.671256e-01 9.672055e-01 7.528977e-04 7.520755e-04 0.077803% -31.090 dB 7.9121e-14% 0.077803% 69.85% 0.109%
Plane-resolved coupling and cross-talk

These values expose propagation-length sensitivity rather than hiding it in the mean.

Pol. Collection beta z=1.20 Collection beta z=1.70 Collection mismatch Excitation beta z=1.20 Excitation beta z=1.70 Excitation mismatch Cross-talk z=1.20 Cross-talk z=1.70
Ex 42.697% 43.792% 2.5322% 0.15071% 0.10984% 31.369% 0.22307% (-26.516 dB) 0.17883% (-27.476 dB)
Ey 40.698% 41.934% 2.9923% 0.036231% 0.058203% 46.534% 0.077849% (-31.087 dB) 0.077758% (-31.093 dB)
Cross-talk normalization and residual diagnostics
Pol. Incident mismatch Reflection P1 Reflection P2 Reflection mismatch Collection orthogonal P1 Collection orthogonal P2 Orthogonal mismatch
Ex 0.38043% 6.176009e-01 6.213488e-01 0.60501% 8.485023e-16 6.843696e-16 21.415%
Ey 0.0082628% 6.714975e-01 6.796423e-01 1.2056% 7.583992e-16 7.720612e-16 1.7853%

The baseline mode-input runs give lower cross-talk for Ey than Ex. Because these bars show the two-plane mean, use the plane-resolved table above when a specific output height or guide length matters.

cross-talk comparison

Field at the emitter under excitation-waveguide input

| Input polarization | |Ex| | |Ey| | |Ez| | |E|^2 | |---|---:|---:|---:|---:| | Ex | 5.630213 | 0.034758 | 0.110528 | 31.712726 | | Ey | 0.204895 | 3.044758 | 1.691603 | 12.174057 |

Mesh convergence study

All four simulations were repeated on a systematically finer mesh with identical geometry, sources, monitors, runtime, and normalization.

Region Baseline mesh Fine mesh
Waveguide region 25 nm 20 nm
Crystal x/y 20 nm 16 nm
Crystal z 12.5 nm 10 nm
Emitter x/y 10 nm 8 nm
Emitter z 8 nm 6 nm
Pol. Collection beta baseline Collection beta fine Relative change Offset-guide beta baseline Offset-guide beta fine Relative change Cross-talk baseline Cross-talk fine Change
Ex 43.245% 43.889% +1.490% 0.13027% 0.13065% +0.290% 0.20099% (-26.968 dB) 0.19749% (-27.044 dB) -1.740% (-0.076 dB)
Ey 41.316% 41.795% +1.159% 0.047217% 0.041983% -11.085% 0.077803% (-31.090 dB) 0.074675% (-31.268 dB) -4.021% (-0.178 dB)
Fine-mesh plane-resolved results
Pol. Dipole total Collection beta z=1.20 Collection beta z=1.70 Collection beta mean Offset-guide beta z=1.20 Offset-guide beta z=1.70 Offset-guide beta mean Cross-talk z=1.20 Cross-talk z=1.70 Cross-talk mean
Ex 1.703323e+03 43.364% 44.414% 43.889% 0.15022% 0.11108% 0.13065% 0.21844% (-26.607 dB) 0.17647% (-27.533 dB) 0.19749% (-27.044 dB)
Ey 1.764630e+03 41.176% 42.414% 41.795% 0.028624% 0.055343% 0.041983% 0.071753% (-31.442 dB) 0.077593% (-31.102 dB) 0.074675% (-31.268 dB)

The refinement plot shows that the collection beta and mean cross-talk move only a few percent. The larger -11.1% Ey offset-guide change applies to a very small leakage channel and is the least mesh-stable reported beta.

relative change under mesh refinement

Baseline and fine mesh geometry

The physical geometry is identical in both batches. These enlarged y-z views document the actual discretization around the 200 nm crystal, both waveguide facets, and the silver interface.

baseline mesh near the device

fine mesh near the device

Fine-mesh mode identification
Polarization Selected mode Collection n_eff Excitation n_eff
Ex 0 1.680644 1.680644
Ey 1 1.656267 1.656267
Fine-mesh dipole coupling details

The table preserves raw matching-mode powers at both monitor planes, the mean beta, and the orthogonal-polarization leakage for both guides.

Pol. Total dipole power Collection P1 Collection P2 Collection beta Collection orthogonal beta Offset-guide P1 Offset-guide P2 Offset-guide beta Offset-guide orthogonal beta
Ex 1.703323e+03 7.386372e+02 7.565086e+02 43.889% 2.618e-15% 2.558784e+00 1.892104e+00 0.13065% 7.8029e-14%
Ey 1.764630e+03 7.266007e+02 7.484509e+02 41.795% 8.6159e-16% 5.051031e-01 9.765932e-01 0.041983% 1.2105e-13%
Fine-mesh excitation-to-collection cross-talk details

Cross-talk is normalized by the incident matching-mode power measured in the excitation guide. P1 and P2 refer to z=1.20 and 1.70 um.

Pol. Incident P1 Incident P2 Collection P1 Collection P2 Matching cross-talk Cross-talk dB Orthogonal conversion Total guided transfer Reflection Collection mismatch
Ex 9.823550e-01 9.788037e-01 2.145900e-03 1.727262e-03 0.19749% -27.044 dB 4.2535e-14% 0.19749% 62.909% 21.617%
Ey 9.677730e-01 9.689326e-01 6.944100e-04 7.518285e-04 0.074675% -31.268 dB 4.5687e-14% 0.074675% 69.393% 7.9404%
Fine-mesh normalization, emitter-field, and residual diagnostics

| Pol. | Incident mismatch | Reflection P1 | Reflection P2 | Reflection mismatch | Orthogonal collection P1 | Orthogonal collection P2 | Orthogonal mismatch | |Ex| at emitter | |Ey| at emitter | |Ez| at emitter | |E|^2 | |---|---:|---:|---:|---:|---:|---:|---:|---:|---:|---:|---:| | Ex | 0.36216% | 6.147733e-01 | 6.189653e-01 | 0.67957% | 4.340196e-16 | 4.001629e-16 | 8.1173% | 5.520082 | 0.031679 | 0.092873 | 30.480929 | | Ey | 0.11974% | 6.673795e-01 | 6.765591e-01 | 1.3661% | 4.161079e-16 | 4.687219e-16 | 11.892% | 0.157201 | 3.046383 | 1.837079 | 12.680020 |

Fine-mesh six-face dipole power budget
Polarization x- x+ y- y+ z- z+
Ex 5.393115e+01 5.393101e+01 9.617221e+01 9.571137e+01 6.245218e+01 1.341125e+03
Ey 8.954815e+01 8.954851e+01 5.286282e+01 5.227798e+01 5.821270e+01 1.422179e+03

Fine-mesh field maps for all four source configurations

These plots are generated from the four fine-mesh HDF5 results, not reused from the baseline. The y-z and emitter-plane x-y views use the same plotting definitions as the baseline figures for direct comparison.

Fine mesh: Ex dipole

The dipole-source maps show radiation launched at the crystal mid-plane and preferential capture by the guide directly above the emitter.

fine mesh Ex dipole yz

fine mesh Ex dipole xy

Fine mesh: Ex excitation-mode input

The input-source maps show the driven excitation guide, the field reaching the emitter location, and the much weaker field admitted to the collection guide.

fine mesh Ex input yz

fine mesh Ex input xy

Fine mesh: Ey dipole

The dipole-source maps show radiation launched at the crystal mid-plane and preferential capture by the guide directly above the emitter.

fine mesh Ey dipole yz

fine mesh Ey dipole xy

Fine mesh: Ey excitation-mode input

The input-source maps show the driven excitation guide, the field reaching the emitter location, and the much weaker field admitted to the collection guide.

fine mesh Ey input yz

fine mesh Ey input xy

Baseline-mesh field maps

These field maps document every baseline source configuration. Each y-z map shows propagation through both vertical guides and the crystal interface; each x-y map shows the field distribution in the emitter plane.

Baseline mesh: Ex dipole

The dipole maps show emission from the crystal mid-plane and the dominant upward field captured by the collection guide; compare the weak field around the guide displaced by 1 um.

Ex dipole yz

Ex dipole xy

Baseline mesh: Ex excitation-mode input

The mode-input maps show the excitation guide driven downward toward the crystal, the field at the emitter, and the smaller field transferred to the collection guide.

Ex input yz

Ex input xy

Baseline mesh: Ey dipole

The dipole maps show emission from the crystal mid-plane and the dominant upward field captured by the collection guide; compare the weak field around the guide displaced by 1 um.

Ey dipole yz

Ey dipole xy

Baseline mesh: Ey excitation-mode input

The mode-input maps show the excitation guide driven downward toward the crystal, the field at the emitter, and the smaller field transferred to the collection guide.

Ey input yz

Ey input xy

Per-face dipole power budget

Polarization x- x+ y- y+ z- z+
Ex 5.710545e+01 5.710495e+01 9.948864e+01 9.936545e+01 6.706456e+01 1.338250e+03
Ey 9.184294e+01 9.184348e+01 5.675381e+01 5.664566e+01 6.260855e+01 1.422634e+03

Cost

  • Prior studies billed: 1.3817 FC.
  • Baseline batch estimate / actual: 1.3204 / 0.1538 FC.
  • Fine-mesh batch estimate / actual: 3.3415 / 0.3341 FC.
  • Current study actual including convergence: 0.4880 FC.
  • Cumulative actual: 1.8696 FC of the authorized 5.0 FC.
Mesh Job Task ID Status Cells Estimated FC Billed FC
baseline pvw_Ex_dipole fdve-d03ef0ce-fecc-4e7a-ac01-a33de605a1fe complete 11,789,631 0.3282 0.0339
baseline pvw_Ex_excitation_input fdve-87fe24b2-6987-49a4-a5fc-0ca5dc2e463f complete 11,789,631 0.3320 0.0430
baseline pvw_Ey_dipole fdve-08864cc7-4790-440e-9467-b0cd62603426 complete 11,789,631 0.3282 0.0339
baseline pvw_Ey_excitation_input fdve-1f4b596a-ec5a-4af9-907b-667f0f17aa51 complete 11,789,631 0.3320 0.0430
fine pvw_fine_Ex_dipole fdve-a685a0f4-32d6-4020-81f3-7deac5c11fb5 complete 23,733,556 0.8334 0.0833
fine pvw_fine_Ex_excitation_input fdve-7d1d7c35-67ab-4b39-8a32-047b86893a96 complete 23,733,556 0.8373 0.0837
fine pvw_fine_Ey_dipole fdve-88b82e84-065a-430b-a1db-e7c1c2535a34 complete 23,733,556 0.8334 0.0833
fine pvw_fine_Ey_excitation_input fdve-5f215747-26ae-4750-8c47-e468b346a434 complete 23,733,556 0.8373 0.0837

Numerical confidence and limitations

  • Both ports use exact mode decomposition, unlike the angled-port aperture approximation in the preceding study.
  • Two z-separated modal planes provide an internal propagation consistency check. Collection-guide dipole beta changes by 2.53% (Ex) and 2.99% (Ey).
  • Ex cross-talk changes by 22.39% between the two planes, while Ey changes by 0.109%. Because the guides remain parallel, local-guide power is propagation-length dependent; the two plane-specific values are more defensible than treating the mean as a universal device number.
  • Fine-mesh reruns changed collection beta by +1.49% (Ex) and +1.16% (Ey), and mean cross-talk by -0.076 dB and -0.178 dB. These headline quantities are mesh-converged to a few percent at the tested refinement.
  • The very weak Ey dipole coupling into the offset guide changed by -11.1% under refinement; treat that small leakage beta as lower confidence.
  • The fine mesh does not remove plane dependence (fine Ex cross-talk plane mismatch is 21.62%). This supports the interpretation that propagation length / coupled-guide beating, rather than mesh alone, controls the exact port-plane value.
  • Domain-size, port-window, and propagation-length sweeps were not performed. Cross-talk must therefore be quoted at a specified z plane or guide length, not as a universal length-independent property.
  • Results are monochromatic at 780 nm and assume an ideal planar cleave, isotropic anthracene, smooth interfaces, and the specified laboratory-frame dipole axes.
  • Specify the physical parallel-guide interaction length and place the reported output port at that height; cross-talk is not length independent.
  • If the design decision depends on sub-0.1 dB accuracy, sweep domain size and port-window size in addition to the completed mesh refinement.
  • Use the fine-mesh Ex and Ey values as the current design estimates, while retaining both plane-specific values as the propagation-length bracket.

Further questions

  • What cleaved-guide length will exist above the crystal before the two guides separate or terminate?
  • Should excitation efficiency be optimized by the local field intensity at the emitter, by absorbed molecular power, or by a saturation-rate model?

Complete machine-readable values: data/metrics.json and data/convergence_metrics.json.

Downloads

FDTD simulation study only -- no GDS/STL deliverable files exist in this tree.


Source: nanophotonic_devices/emitter_coupling/anthracene_parallel_vertical_waveguides_v1/